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首页> 外文期刊>Japanese journal of applied physics >Study on the Frequency Dependence of Lateral Energy Leakage in RF Bulk Acoustic Wave Device by Fast-Scanning Laser Probe System
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Study on the Frequency Dependence of Lateral Energy Leakage in RF Bulk Acoustic Wave Device by Fast-Scanning Laser Probe System

机译:快速扫描激光探针系统研究射频大体积声波器件侧向能量泄漏的频率依赖性

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摘要

This paper describes the application of the developed fast-scanning laser probe system to the diagnosis of frequency dependence of lateral energy leakage occurring in RF bulk acoustic wave (BAW) devices. According to wavenumber domain analyses, dispersion relation for the device under test is derived, the leakage behaviors at different frequencies are shown as images, and energy of each lateral mode is evaluated quantitatively. The cause of the lateral energy leakage and its frequency dependence are discussed. It is shown that the cause of lateral energy leakage is the higher order transverse modes which are not excited at frequency higher than a cut-off frequency (f_c) for the longitudinal extension mode. It is demonstrated that by using this laser probe system, the lateral energy leakage variation upon frequency can be seen intuitively, and the underlying mechanism for the leakage can be analyzed and explained clearly.
机译:本文介绍了已开发的快速扫描激光探针系统在诊断RF体声波(BAW)设备中发生的侧向能量泄漏的频率相关性中的应用。根据波数域分析,推导了被测器件的色散关系,将不同频率下的泄漏行为示为图像,并对每个横向模的能量进行了定量评估。讨论了横向能量泄漏的原因及其频率依赖性。结果表明,侧向能量泄漏的原因是高阶横向模式,这些模式在高于纵向延伸模式的截止频率(f_c)的频率下未被激发。结果表明,通过使用该激光探针系统,可以直观地看到横向能量泄漏随频率的变化,并且可以清楚地分析和解释泄漏的潜在机理。

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  • 来源
    《Japanese journal of applied physics》 |2009年第7issue2期|07GG01.1-07GG01.4|共4页
  • 作者单位

    Graduate School of Engineering, Chiba University, Inage-ku, Chiba 263-8522, Japan;

    Graduate School of Engineering, Chiba University, Inage-ku, Chiba 263-8522, Japan;

    Graduate School of Engineering, Chiba University, Inage-ku, Chiba 263-8522, Japan;

    Graduate School of Engineering, Chiba University, Inage-ku, Chiba 263-8522, Japan;

    Graduate School of Engineering, Chiba University, Inage-ku, Chiba 263-8522, Japan;

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