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首页> 外文期刊>Japanese journal of applied physics >Anisotropic Transformation of 4H-SiC Etching Shapes by High-Temperature Annealing and Its Enhancement by Ion Implantation
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Anisotropic Transformation of 4H-SiC Etching Shapes by High-Temperature Annealing and Its Enhancement by Ion Implantation

机译:高温退火对4H-SiC刻蚀形状的各向异性转变及其离子注入的增强

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摘要

The transformation of 4H-SiC etching shapes by high-temperature annealing was investigated. Although the opening of the etching mask was circular, the resulting etched shape was a hexagon, dodecagon, or rounded polygon with more edges, depending on the diameter. A hexagon was transformed into a dodecagon following high-temperature annealing, and a dodecagon was transformed into a rounded polygon.
机译:研究了高温退火对4H-SiC刻蚀形状的影响。尽管蚀刻掩模的开口是圆形的,但是根据直径,所得的蚀刻形状为具有更多边缘的六边形,十二边形或倒圆的多边形。在高温退火之后,将六边形转变为十二边形,并将十二边形转变为圆形多边形。

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  • 来源
    《Japanese journal of applied physics 》 |2010年第4issue1期| P.040203.1-040203.3| 共3页
  • 作者单位

    Advanced Technology Laboratory, Fuji Electric Holdings Co., Ltd., Hino, Tokyo 191-8502, Japan;

    rnAdvanced Technology Laboratory, Fuji Electric Holdings Co., Ltd., Hino, Tokyo 191-8502, Japan;

    rnAdvanced Technology Laboratory, Fuji Electric Holdings Co., Ltd., Hino, Tokyo 191-8502, Japan;

    rnAdvanced Technology Laboratory, Fuji Electric Holdings Co., Ltd., Hino, Tokyo 191-8502, Japan;

    rnAdvanced Technology Laboratory, Fuji Electric Holdings Co., Ltd., Hino, Tokyo 191-8502, Japan;

    rnAdvanced Technology Laboratory, Fuji Electric Holdings Co., Ltd., Hino, Tokyo 191-8502, Japan;

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