...
机译:未来金属-绝缘体-金属电容器用多层介电薄膜的比较:Al_2O_3 / HfO_2 / Al_2O_3与SiO_2 / HfO_2 / SiO_2
Department of Electronics Engineering, Chungnam National University, Daejeon 305-764, Korea,Hynix Semiconductor Inc., Ichon, Gyeonggi 467-701, Korea;
Department of Electronics Engineering, Chungnam National University, Daejeon 305-764, Korea;
Department of Electronics Engineering, Chungnam National University, Daejeon 305-764, Korea;
Department of Electronics Engineering, Chungnam National University, Daejeon 305-764, Korea;
Department of Electronics Engineering, Chungnam National University, Daejeon 305-764, Korea;
Department of Electronics Engineering, Chungnam National University, Daejeon 305-764, Korea;
Dongbu HiTec Semiconductor Inc., Seoul 891-10, Korea;
Dongbu HiTec Semiconductor Inc., Seoul 891-10, Korea;
International SEMATECH, Austin, TX 78741, U.S.A;
Department of Materials Science and Engineering, Gwangju Institute of Science and Technology (GIST), Gwangju 500-712, Korea;
International SEMATECH, Austin, TX 78741, U.S.A;
Department of Electronics Engineering, Chungnam National University, Daejeon 305-764, Korea;
机译:用于电荷陷阱存储应用的多层Al_2O_3 / HfO_2 / SiO_2 / Si_3N_4 / SiO_2薄电介质
机译:基于InGaAs的金属氧化物半导体(MOS)电容器中HfO_2 / Al_2O_3纳米叠层与三元Hf_xAl_yO化合物作为介电材料的比较
机译:Pt OE n〜+ .PGTAL-SILICQN栅的高k栅介电薄膜(HfO_2和Al_2O_3)的电性能比较
机译:HfO_2 / SiO_2薄膜对中近紫外的界面吸收与膜吸收的关系及其与脉冲激光损伤的关系
机译:了解电容器应用的多层聚合物膜的损失机制和增强介电性能
机译:从封面开始:用于低压有机薄膜晶体管的σ-π分子电介质多层
机译:高效宽带高分散HfO_2 / SiO_2多层反射镜,用于近紫外脉冲压缩