...
首页> 外文期刊>Japanese journal of applied physics >Semiconducting Properties of Nanostructured Amorphous Carbon Thin Films Incorporated with Iodine by Thermal Chemical Vapor Deposition
【24h】

Semiconducting Properties of Nanostructured Amorphous Carbon Thin Films Incorporated with Iodine by Thermal Chemical Vapor Deposition

机译:热化学气相沉积结合碘的纳米结构非晶碳薄膜的半导体性能

获取原文
获取原文并翻译 | 示例

摘要

Nanostructured iodine-post doped amorphous carbon (a-C:l) thin films were prepared from camphor oil using a thermal chemical vapor deposition (TCVD) technique at different doping temperatures. The structural properties of the films were studied by field-emission scanning electron microscopy (FESEM), energy-dispersive spectroscopy (EDS), Raman, and Fourier transform infrared (FTIR) studies. FESEM and EDS studies showed successful iodine doping. FTIR and Raman studies showed that the a-C:l thin films consisted of a mixture of sp~2- and sp~3-bonded carbon atoms. The optical and electrical properties of a-C:l thin films were determined by UV-vis-NIR spectroscopy and current-voltage (I-V) measurement respectively. The optical band gap of a-C thin films decreased upon iodine doping. The highest electrical conductivity was found at 400℃ doping. Heterojunctions are confirmed by rectifying the I-V characteristics of an a-C:I-Si junction.
机译:使用热化学气相沉积(TCVD)技术在不同的掺杂温度下,从樟脑油制备了纳米结构的碘后掺杂非晶碳(a-C:l)薄膜。通过场发射扫描电子显微镜(FESEM),能量色散光谱(EDS),拉曼和傅立叶变换红外(FTIR)研究了薄膜的结构性能。 FESEM和EDS研究表明,碘掺杂成功。 FTIR和拉曼研究表明,a-C:l薄膜由sp〜2和sp〜3键合碳原子的混合物组成。通过UV-vis-NIR光谱法和电流-电压(I-V)测量分别确定a-C:l薄膜的光学和电学性质。碘掺杂后,a-C薄膜的光学带隙减小。在400℃掺杂下发现最高的电导率。异质结可以通过校正a-C:I / n-Si结的I-V特性来确认。

著录项

  • 来源
    《Japanese journal of applied physics 》 |2013年第11issue2期| 11NL02.1-11NL02.8| 共8页
  • 作者单位

    NANO-ElecTronic Centre (NET), Faculty of Electrical Engineering, Universiti Teknologi MARA (UiTM), 40450 Shah Alam, Selangor, Malaysia;

    NANO-ElecTronic Centre (NET), Faculty of Electrical Engineering, Universiti Teknologi MARA (UiTM), 40450 Shah Alam, Selangor, Malaysia;

    NANO-ElecTronic Centre (NET), Faculty of Electrical Engineering, Universiti Teknologi MARA (UiTM), 40450 Shah Alam, Selangor, Malaysia;

    NANO-ElecTronic Centre (NET), Faculty of Electrical Engineering, Universiti Teknologi MARA (UiTM), 40450 Shah Alam, Selangor, Malaysia,NANO-SciTech Centre (NST), Institute of Science, UniversitiTeknologi MARA (UiTM), 40450 Shah Alam, Selangor, Malaysia;

  • 收录信息
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号