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首页> 外文期刊>Japanese journal of applied physics >Novel Technique for Improving the Signal-to-Background Ratio of X-ray Absorption Near-Edge Structure Spectrum in Fluorescence Mode and Its Application to the Chemical State Analysis of Magnesium Doped in GaN
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Novel Technique for Improving the Signal-to-Background Ratio of X-ray Absorption Near-Edge Structure Spectrum in Fluorescence Mode and Its Application to the Chemical State Analysis of Magnesium Doped in GaN

机译:荧光模式下提高X射线吸收近边缘结构光谱信噪比的新技术及其在掺杂镁的GaN化学状态分析中的应用

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摘要

A novel measurement technique for an X-ray absorption near-edge structure (XANES) for magnesium (Mg) doped in gallium nitride (GaN) has been developed. XANES spectra from Mg at very low concentrations of 1 × 10~(18)/cm~3 doped in GaN have successfully been obtained by optimizing the region of interest (ROI) and by using highly brilliant synchrotron radiation X-rays of SPring-8. The ROI is the limited energy region from an X-ray fluorescence spectrum to elicit signals of particular atoms. Using this new technique, we have investigated the effect of the annealing process for Mg-doped GaN on the XANES spectra. It has been found that the XANES spectra of Mg significantly changed as the annealing temperature increased. This indicates that the local structure around Mg atoms in GaN was modified by the annealing process.
机译:已经开发出一种新的测量技术,该技术用于掺杂在氮化镓(GaN)中的镁(Mg)的X射线吸收近边缘结构(XANES)。通过优化目标区域(ROI)和使用SPring-8的高强同步辐射X射线,成功地获得了掺杂在GaN中的Mg浓度极低的1×10〜(18)/ cm〜3的XANES光谱。 ROI是从X射线荧光光谱发出特定原子信号的有限能量区域。使用这项新技术,我们研究了掺杂Mg的GaN的退火工艺对XANES光谱的影响。已经发现,随着退火温度的升高,Mg的XANES光谱显着改变。这表明GaN中Mg原子周围的局部结构已通过退火工艺进行了改性。

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  • 来源
    《Japanese journal of applied physics》 |2013年第12期|126602.1-126602.4|共4页
  • 作者单位

    Sumitomo Electric Industries, Ltd., Osaka 554-0024, Japan;

    Sumitomo Electric Industries, Ltd., Osaka 554-0024, Japan;

    Sumitomo Electric Industries, Ltd., Osaka 554-0024, Japan;

    Sumitomo Electric Industries, Ltd., Osaka 554-0024, Japan;

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