首页> 外国专利> METHOD FOR IMPROVING RESOLUTION IN ANALYSIS OF EXTENDED X-RAY ABSORPTION FINE STRUCTURE SPECTRUM OF SOLID

METHOD FOR IMPROVING RESOLUTION IN ANALYSIS OF EXTENDED X-RAY ABSORPTION FINE STRUCTURE SPECTRUM OF SOLID

机译:固体X射线吸收精细结构光谱分析中提高分辨率的方法

摘要

PURPOSE: A method for improving resolution in an analysis of an extended x-ray absorption fine structure spectrum of a solid is provided, in which atom groups mixed by Fourier transformation are able to be separated so that increasing the resolution, obtain a real radial distribution and directly and precisely obtain a distance between atoms without fitting by a RegXAFS program. CONSTITUTION: A method for improving resolution in an analysis of an extended x-ray absorption fine structure spectrum of a solid includes the steps of making a filtered extended x-ray absorption fine structure(EXAFS) spectrum of a solid by reading raw data, extracting a filtered EXAFS spectrum and carrying out Fourier transformation and inverse Fourier transformation with relation to the extracted filtered EXAFS spectrum(S10), producing Kernel data(S20), and carrying out a RegXAFS program for analyzing the EXAFS spectrum.
机译:目的:提供一种在固体的扩展X射线吸收精细结构光谱分析中提高分辨率的方法,其中能够分离通过傅立叶变换混合的原子团,从而提高分辨率,获得真实的径向分布无需RegXAFS程序就能直接准确地获得原子之间的距离。构成:一种用于分析固体的扩展X射线吸收精细结构光谱的分辨率的方法,包括以下步骤:通过读取原始数据,提取出固体的过滤后的扩展X射线吸收精细结构(EXAFS)光谱,过滤EXAFS频谱,并对提取的过滤EXAFS频谱进行傅里叶变换和傅里叶逆变换(S10),生成内核数据(S20),并执行RegXAFS程序分析EXAFS频谱。

著录项

  • 公开/公告号KR20010008885A

    专利类型

  • 公开/公告日2001-02-05

    原文格式PDF

  • 申请/专利权人 UNIVERSITY INDUSTRIAL TECHNOLOGY FORCE;

    申请/专利号KR19990026926

  • 发明设计人 YANG DONG SEOK;

    申请日1999-07-05

  • 分类号G01N23/083;

  • 国家 KR

  • 入库时间 2022-08-22 01:14:17

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