...
首页> 外文期刊>Japanese journal of applied physics >Analysis of interfacial energy states in Au/pentacene/polyimide/indium-zinc-oxide diodes by electroluminescence spectroscopy and electric-field-induced optical second-harmonic generation measurement
【24h】

Analysis of interfacial energy states in Au/pentacene/polyimide/indium-zinc-oxide diodes by electroluminescence spectroscopy and electric-field-induced optical second-harmonic generation measurement

机译:电致发光光谱法和电场诱导的光学二次谐波测量法分析金/并五苯/聚酰亚胺/铟锌氧化物二极管中的界面能态

获取原文
获取原文并翻译 | 示例

摘要

By using electroluminescence (EL) spectroscopy and electric-field-induced optical second-harmonic generation (EFISHG) measurement, we analyzed interfacial energy states in Au/pentacene/polyimide/indium-zinc-oxide (IZO) diodes, to characterize the pentacene/polyimide interface. Under positive voltage application to the Au electrode with reference to the IZO electrode, the EFISHG showed that holes are injected from Au electrode, and accumulate at the pentacene/polyimide interface with the surface charge density of Q(s) = 3.8 x 10(-7) C/cm(2). The EL spectra suggested that the accumulated holes are not merely located in the pentacene but they are transferred to the interface states of polyimide. These accumulated holes distribute with the interface state density greater than 10(12)cm(-2) eV(-1) in the range E = 1.5-1.8 and 1.7-2.4 eV in pentacene and in polyimide, respectively, under assumption that accumulated holes govern recombination radiation. The EL-EFISHG measurement is helpful to characterize organic-organic layer interfaces in organic devices and provides a way to analyze interface energy states. (C) 2016 The Japan Society of Applied Physics
机译:通过使用电致发光(EL)光谱和电场诱导的光学二次谐波生成(EFISHG)测量,我们分析了Au /并五苯/聚酰亚胺/铟锌氧化物(IZO)二极管中的界面能态,以表征并五苯/聚酰亚胺界面。在相对于IZO电极向Au电极施加正电压的情况下,EFISHG显示空穴是从Au电极注入的,并在并五苯/聚酰亚胺界面处积累,表面电荷密度Q(s)= 3.8 x 10(- 7)C / cm(2)。 EL光谱表明,累积的空穴不仅位于并五苯中,而且还转移至聚酰亚胺的界面态。在假定并发的情况下,这些并存的空穴在并五苯和聚酰亚胺中的界面态密度分别大于10(12)cm(-2)eV(-1)分布在E = 1.5-1.8和1.7-2.4 eV范围内孔控制重组辐射。 EL-EFISHG测量有助于表征有机器件中的有机-有机层界面,并提供分析界面能态的方法。 (C)2016年日本应用物理学会

著录项

  • 来源
    《Japanese journal of applied physics 》 |2016年第3s2期| 03DC04.1-03DC04.5| 共5页
  • 作者单位

    Tokyo Inst Technol, Dept Phys Elect, Meguro Ku, Tokyo 1528552, Japan;

    Tokyo Inst Technol, Dept Phys Elect, Meguro Ku, Tokyo 1528552, Japan;

    Tokyo Inst Technol, Dept Phys Elect, Meguro Ku, Tokyo 1528552, Japan;

  • 收录信息
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

相似文献

  • 外文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号