首页> 外国专利> OPTICAL MEASUREMENT ANALYSIS DEVICE, STOREHOUSE, ELECTROMAGNETIC WAVE GENERATION DEVICE, AND OPTICAL MEASUREMENT ANALYSIS METHOD

OPTICAL MEASUREMENT ANALYSIS DEVICE, STOREHOUSE, ELECTROMAGNETIC WAVE GENERATION DEVICE, AND OPTICAL MEASUREMENT ANALYSIS METHOD

机译:光学测量分析装置,仓库,电磁波产生装置以及光学测量分析方法

摘要

PROBLEM TO BE SOLVED: To provide an optical measurement analysis device capable of acquiring an optical spectrum by irradiating the entire surface of an object to be analyzed with light as a device which takes an optical measurement analysis.;SOLUTION: The optical measurement analysis device comprises a light source 10, a light irradiation part 11, a light reception part 13, a spectroscopic part 14, and an analysis part 17 which analyzes a spectrum of light obtained by the spectroscopic part 14, and an inner wall of a container 12 is configured to reflect light which is reflected by an object to be measured and a light transmitted through the object to be measured. Precision of the analysis can be improved by using such an optical measurement analysis device and irradiating a substantially entire surface of the object to be analyzed with light with good efficiency.;COPYRIGHT: (C)2013,JPO&INPIT
机译:解决的问题:提供一种光学测量分析装置,该光学测量分析装置作为进行光学测量分析的装置,能够通过向被分析物的整个表面照射光来获取光谱。构成光源10,光照射部11,受光部13,分光镜部14,以及分析部17,分析部17对由分光镜部14获得的光的光谱进行分析,并构成容器12的内壁。反射由被测物体反射的光和透过被测物体的光。通过使用这样的光学测量分析装置并以高效率照射光来对待分析对象的大致整个表面进行分析,可以提高分析的精度。版权所有:(C)2013,JPO&INPIT

著录项

  • 公开/公告号JP2013019673A

    专利类型

  • 公开/公告日2013-01-31

    原文格式PDF

  • 申请/专利权人 SHARP CORP;

    申请/专利号JP20110150644

  • 发明设计人 OKUMURA TOSHIYUKI;MATSUDA KYOKO;

    申请日2011-07-07

  • 分类号G01N21/27;F25D11/00;F25D11/02;

  • 国家 JP

  • 入库时间 2022-08-21 17:00:19

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