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Metrology and the challenge of the nanoscale

机译:计量与纳米级的挑战

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Metrology as the science of measurement is one of the main challenges of the nano-scale. Referring to measurement needs and measurement devices, scientists and engineers often quote Lord Kelvin, Sir William Thomson: "In physical science the first essential step in the direction of learning any subject is to find principles of numerical reckoning and practical methods for measuring some quality connected with it. I often say that when you can measure what you are speaking about, and express it in numbers, you know something about it; but when you cannot meas- ure it, when you cannot express it in numbers, your knowledge is of a meagre and unsatisfactory kind; it may be the beginning of knowledge, but you have scarcely in your thoughts advanced to the state of Science, whatever the matter may be." [PLA, vol. 1, "Electrical Units of Measurement", 1883-05-03].
机译:测量科学的计量是纳米规模的主要挑战之一。参考测量需求和测量设备,科学家和工程师经常引用Kelvin勋爵,威廉·汤姆森爵士:“在物理科学中,学习方向的第一个基本步骤是为了找到数值估算和实用方法来测量一些质量的方法。用它。我经常说,当你能衡量你正在谈到的东西时,并以数字表达它,你知道它的事情;但是当你不能测量它时,当你不能用数字表达它时,你的知识就是一种微薄和不满意的善意;它可能是知识的开始,但你几乎没有于你的思想向科学状态提出,无论什么事情都是如此。“ [PLA,VOL。 1,“电气测量单元”,1883-05-03]。

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