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首页> 外文期刊>International Journal of Microcircuits & Electronic Packaging >Transient Thermal Analysis of Wave Soldering Process for an Optical Encoder Module
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Transient Thermal Analysis of Wave Soldering Process for an Optical Encoder Module

机译:光学编码器模块波峰焊过程的瞬态热分析

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摘要

Severe delamination at the interfaces of leadframe/mold compound and leadframe/die attach epoxy has been observed right after the wave soldering process for an optical encoder package. During wave soldering process, package is heated up by the hot ambient and the molten solder. As temperature increases, package is more prone to delamination due to degradation of adhesion strength. Finite Element Analysis (FEA) has been conducted to model the wave soldering process using the measured lead temperature as thermal boundary condition. Convective heating and cooling are considered. The dynamic temperature response of the package has been captured and analyzed. Several approaches inclusive of changing leadframe material, removing housing and altering mounting configuration, have been examined to obtain the best design that yield lowest package temperature. Experiment is conducted and the experimental results have been compared with the numerically predicted data and the agreement is good.
机译:在光学编码器封装的波峰焊过程之后,就已经观察到引线框/模具化合物和引线框/管芯附着环氧树脂之间的界面严重脱层。在波峰焊过程中,封装被热的环境和熔化的焊料加热。随着温度升高,由于粘合强度降低,包装更容易分层。进行了有限元分析(FEA)以将测得的铅温度作为热边界条件来模拟波峰焊过程。考虑对流加热和冷却。包装的动态温度响应已被捕获和分析。已经研究了几种方法,包括更改引线框材料,移除外壳和更改安装配置,以获得能够产生最低封装温度的最佳设计。进行了实验,并将实验结果与数值预测数据进行了比较,吻合良好。

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