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首页> 外文期刊>Journal of Microelectronics and Electronic Packaging >Vertical Arrays of Copper Nanotube Grown on Silicon Substrate by CMOS Compatible Electrochemical Process for IC Packaging Applications
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Vertical Arrays of Copper Nanotube Grown on Silicon Substrate by CMOS Compatible Electrochemical Process for IC Packaging Applications

机译:CMOS兼容电化学工艺在硅基板上生长的铜纳米管的垂直阵列,用于IC封装应用

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摘要

We present an electrodeposition-based fabrication process which can be complementary metal oxide semiconductor (CMOS) compatible for creating vertical arrays of copper (Cu) nanotubes for integrated circuit (IC) packaging applications. Since such nanotube structures offer high surface-to-volume ratios, low resistivity, and high thermal conductivity, they are especially suited for IC packaging applications requiring efficient heat transfer as well as electrical interconnect applications. In this work, Cu nanotube arrays were electrodeposited into alumina nanopore templates with pore diameters of approximately 50 nm and 100 nm. Simulation and measurements of the vertical arrays of Cu nanotubes showed greatly enhanced thermal conductivity in the direction of nanotube alignment compared with Cu nanowires and bulk Cu. The thermal conductivity of the vertical arrays of Cu nanotubes at 100°C is about 0.35W/m·K compared to the 0.24 W/m·K from Cu bulk materials, which shows an enhancement of about 146% as a result of the more efficient thermal conduction in Cu nanotubes.
机译:我们提出了一种基于电沉积的制造工艺,该工艺可以与互补金属氧化物半导体(CMOS)兼容,以创建用于集成电路(IC)封装应用的铜(Cu)纳米管垂直阵列。由于这种纳米管结构具有高的表面体积比,低电阻率和高导热率,因此特别适合需要高效传热的IC封装应用以及电互连应用。在这项工作中,将铜纳米管阵列电沉积到孔径约为50 nm和100 nm的氧化铝纳米孔模板中。铜纳米管垂直阵列的仿真和测量显示,与铜纳米线和块状铜相比,沿纳米管排列方向的导热系数大大提高。 Cu纳米管垂直阵列在100°C时的热导率约为0.35W / m·K,而Cu块状材料的热导率仅为0.24 W / m·K,这表明铜纳米管垂直阵列的热导率提高了约146%。铜纳米管中的高效导热。

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