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首页> 外文期刊>Journal of Microelectronics and Electronic Packaging >Response Predicting LTCC Firing Shrinkage: A Response Surface Analysis Study
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Response Predicting LTCC Firing Shrinkage: A Response Surface Analysis Study

机译:响应预测LTCC点火收缩:响应面分析研究

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Low temperature cofired ceramic (LTCC) technology is used in a variety of applications including military/space electronics, wireless communication, MEMS, and medical and automotive electronics. The use of LTCC is growing due to the low cost of investment, short development time, good electrical and mechanical properties, high reliability, and flexibility in design integration (i.e., three dimensional microstructures with cavities are possible). The dimensional accuracy of the resulting x/y shrinkage of LTCC substrates is responsible for component assembly problems with a tolerance effect that increases in relation to the substrate size. Response surface analysis was used to predict product shrinkage based on specific process inputs (metal loading, layer count, lamination pressure, and tape thickness) with the ultimate goal to optimize manufacturing outputs (NC files, stencils, and screens) in achieving the final product design the first time. Three regression models were developed for the DuPont 951 tape system with DuPont 5734 gold metallization based on green tape thickness.
机译:低温共烧陶瓷(LTCC)技术用于多种应用,包括军事/太空电子,无线通信,MEMS,医疗和汽车电子。由于投资成本低,开发时间短,良好的电气和机械性能,高可靠性以及设计集成的灵活性(即可能具有空腔的三维微结构),LTCC的使用正在增长。所产生的LTCC基板x / y收缩的尺寸精度是造成组件装配问题的原因,其公差效应随基板尺寸而增加。响应表面分析用于根据特定的工艺输入(金属负载,层数,层压压力和胶带厚度)预测产品收缩,最终目标是优化生产输出(NC文件,模板和丝网)以最终产品第一次设计。为杜邦951胶带系统开发了三个回归模型,基于生胶带厚度,杜邦5734镀金。

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