Magnetic force microscopy of superconductors

摘要

The interaction between a magnetized probe tip and a sample provides the basis for the imaging technique of magnetic force microscopy (MFM). This paper addresses MFM modelling for superconductors, for both direct and inverse problems. In the direct problem, material properties are assumed, while in the inverse problem the sample characteristics are to be extracted from the force measurements. Some of the challenges and benefits of solving MFM problems for superconductors are described. Understanding of the direct problem can be useful for materials optimization and device fabrication, while solution of the inverse problem could be used as a means of contactless quality assessment. Developments in the latter area could provide a new method of characterizing superconducting crystals and films.