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Statistical timing and power analysis of VLSI considering non-linear dependence

机译:考虑非线性相关性的VLSI统计时序和功率分析

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摘要

Majority of practical multivariate statistical analysis and optimizations model interdependence among random variables in terms of the linear correlation. Though linear correlation is simple to use and evaluate, in several cases non-linear dependence between random variables may be too strong to ignore. In this paper, we propose polynomial correlation coefficients as simple measure of multi-variable non-linear dependence and show that the need for modeling non-linear dependence strongly depends on the end function that is to be evaluated from the random variables. Then, we calculate the errors in estimation resulting from assuming independence of components generated by linear de-correlation techniques, such as PCA and ICA. The experimental results show that the error predicted by our method is within 1% error compared to the real simulation of statistical timing and leakage analysis. In order to deal with non-linear dependence, we further develop a target-function-driven component analysis algorithm (FCA) to minimize the error caused by ignoring high order dependence. We apply FCA to statistical leakage power analysis and SRAM cell noise margin variation analysis. Experimental results show that the proposed FCA method is more accurate compared to the traditional PCA or ICA. Published by Elsevier B.V.
机译:实用的多元统计分析和优化的多数方法是根据线性相关性来建模随机变量之间的相互依赖性。尽管线性相关性易于使用和评估,但在某些情况下,随机变量之间的非线性相关性可能太强而无法忽略。在本文中,我们提出多项式相关系数作为多变量非线性相关性的简单度量,并表明对非线性相关性进行建模的需求在很大程度上取决于要从随机变量评估的最终函数。然后,我们假设由线性解相关技术(例如PCA和ICA)生成的分量的独立性,从而得出估计误差。实验结果表明,与统计时序和泄漏分析的真实模拟相比,我们的方法预测的误差在1%以内。为了处理非线性相关性,我们进一步开发了一种目标函数驱动的组件分析算法(FCA),以最大程度地减少忽略高阶相关性引起的误差。我们将FCA应用于统计泄漏功率分析和SRAM单元噪声容限变化分析。实验结果表明,与传统的PCA或ICA相比,提出的FCA方法更加准确。由Elsevier B.V.发布

著录项

  • 来源
    《Integration 》 |2014年第4期| 487-498| 共12页
  • 作者单位

    Univ Calif Los Angeles, Dept Elect Engn, Los Angeles, CA 90095 USA;

    SUNY Buffalo, Buffalo, NY 14260 USA;

    Univ Calif Los Angeles, Dept Elect Engn, Los Angeles, CA 90095 USA;

    Univ Calif Los Angeles, Dept Elect Engn, Los Angeles, CA 90095 USA;

    Univ Calif Los Angeles, Dept Elect Engn, Los Angeles, CA 90095 USA;

    Univ Calif Los Angeles, Dept Elect Engn, Los Angeles, CA 90095 USA;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Statistical modeling; VLSI; Yield analysis;

    机译:统计建模;超大规模集成电路;产量分析;

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