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Interferometric Measurement of the Diameter of a Silicon Sphere With a Mechanical Scanning Method

机译:机械扫描法干涉测量硅球直径

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The diameter of a 1-kg silicon sphere needs to be accurately measured to determine the volume and density to investigate the Avogadro constant. The diameter of the silicon sphere was measured using phase-shifting interferometry with an algorithm with an accuracy of 0.01% of the phase period. The algorithm accurately analyzes the phase map without strict positioning of the phase-shifting step. A phase-shifting generator was then designed to accurately determine the diameter. The distances between the two Etalon plates were measured with a phase shift of 1 $muhbox{m}$ with the gaps between the surface of the silicon sphere and each Etalon plate measured with a phase shift of 2 $muhbox{m}$ by the mechanical scanning method. The Etalon cavity length changes by only 0.1 nm when the pressure is released. The combined standard uncertainty in the silicon sphere diameter is then less than 2.3 nm.
机译:需要精确测量1公斤硅球的直径,以确定体积和密度以研究Avogadro常数。硅球的直径是使用相移干涉术和算法以相周期的0.01%的精度测量的。该算法无需严格定位移相步骤即可准确地分析相位图。然后设计了相移发生器以精确确定直径。两个Etalon板之间的距离以1 $ muhbox {m} $的相移测量,而硅球表面和每个Etalon板之间的间隙以2 $ muhbox {m} $的相移来测量。机械扫描方法。释放压力时,Etalon腔长度仅改变0.1 nm。然后,硅球直径的组合标准不确定度小于2.3 nm。

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