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Reference-free interpretation of flash thermography data

机译:闪光灯热成像数据的无参考解释

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摘要

The Thermographic Signal Reconstruction (TSR) method has become a widely accepted approach to processing and interpreting active thermography data, since its introduction six years ago. Initially, the technique was used to create compact, noise-free sequences replicas of flash thermography data. Derivatives of the replica were used to obtain increased sensitivity, noise and artifact suppression, and reference-free evaluation and quantification of results. However, the derivative of a single pixel time history can also be analysed without reference to adjacent pixels to detect the presence of a subsurface defect, or in the absence of a defect, it can be used to measure the local thermal diffusivity, sample thickness or defect depth. In this article, we illustrate the behaviour of the derivative in some basic cases, and show how it can be used to infer the subsurface state of a sample.
机译:自六年前问世以来,热成像信号重建(TSR)方法已成为处理和解释有效热成像数据的一种广泛接受的方法。最初,该技术用于创建紧凑的,无噪声的闪光热成像数据序列副本。复制品的衍生物用于获得更高的灵敏度,噪声和伪影抑制,以及无参考的评估和结果量化。但是,也可以在不参考相邻像素的情况下分析单个像素时间历史的导数,以检测是否存在次表面缺陷,或者在不存在缺陷的情况下,可以用于测量局部热扩散率,样品厚度或缺陷深度。在本文中,我们说明了一些基本情况下的导数行为,并展示了如何将其用于推断样品的表面状态。

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