Ultra-compact high-resolution and high-sensitivity radioscopy system for materials research

摘要

InnospeXion ApS (Denmark) has launched the new IX-SMIS micron resolution X-radioscopy system of extreme sensitivity. The system is targeted at the markets requesting high precision, reliable and robust technology for off-line or at-line inspection of small parts and materials, for example R&D establishments, materials laboratories, electronic manufacturing, pharmaceutical micro devices, etc.The system is a stand-alone system for computed-aided inspection of one . component at a time. The parts are inserted through the manually-operated sliding door at the top, where the part is positioned on a 4-axis manipulator, operated through a PC user interface. Optionally, a motorised door and a pick-and-place 'robot functionality may be supplied.