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High-pressure synthesis of H2Ta2O6 center dot H2O with a defect pyrochlore structure

机译:高压合成烧绿石结构缺陷的H2Ta2O6中心点H2O

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摘要

Using high-pressure heat treatment of amorphous low-hydrated tantalum hydroxide of composition TaO0.5-2.0(OH)(4-1) center dot 1.0-2.5H(2)O at p = 5.0 GPa and t = 600-750A degrees C, we obtained a mixture of two phases: H2Ta2O6 center dot H2O with a defect pyrochlore structure (sp. gr. Fd3m, a = 10.5956(1) , Z = 8, V = 1189.53(3) (3)) and TT-Ta2O5 (delta) (alpha-UO3 structure, sp. gr. P3 m1, a = 3.6368(2) , c = 3.8943(5) , Z = 1, V = 44.61 (3)). The X-ray diffraction data for these compounds were analyzed by the Rietveld method. The agreement factors obtained are R (F) = 0.0541 for H2Ta2O6 center dot H2O and R (F) = 0.0885 for TT-Ta2O5. These phases are assumed to form an intergrowth structure along certain crystallographic planes. We have proposed a mechanism of intergrowth structure formation in the [111] direction of the pyrochlore structure and in the [001] direction of TT-Ta2O5.
机译:使用高压热处理无定形低水合氢氧化钽Ta00.5-2.0(OH)(4-1)中心点1.0-2.5H(2)O,p = 5.0 GPa和t = 600-750A度C,我们得到了两相的混合物:具有缺陷烧绿石结构的H2Ta2O6中心点H2O(sp。gr。Fd3m,a = 10.5956(1),Z = 8,V = 1189.53(3)(3))和TT- Ta 2 O 5δ(α-UO3结构,sp.gr.P3 m1,a = 3.6368(2),c = 3.8943(5),Z = 1,V = 44.61(3))。这些化合物的X射线衍射数据通过Rietveld方法分析。对于H2Ta2O6中心点H2O,获得的一致性因子为R(F)= 0.0541,对于TT-Ta2O5,R(F)= 0.0885。假定这些相沿某些晶体学平面形成共生结构。我们已经提出了在烧绿石结构的[111]方向和TT-Ta2O5的[001]方向的共生结构形成的机理。

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  • 来源
    《Inorganic materials》 |2016年第1期|38-43|共6页
  • 作者单位

    Russian Acad Sci, Vereshchagin Inst High Pressure Phys, Moscow 142190, Russia;

    Russian Acad Sci, Vereshchagin Inst High Pressure Phys, Moscow 142190, Russia;

    Lomonosov State Univ Fine Chem Technol, Moscow 119571, Russia;

    Lomonosov State Univ Fine Chem Technol, Moscow 119571, Russia;

    Lomonosov State Univ Fine Chem Technol, Moscow 119571, Russia;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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  • 正文语种 eng
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