首页> 外文期刊>Inorganic materials: applied research >Degradation of Spacecraft's Temperature-Control Coatings during Deposition of Thin Au Films
【24h】

Degradation of Spacecraft's Temperature-Control Coatings during Deposition of Thin Au Films

机译:薄Au薄膜沉积期间航天器的温度控制涂层的劣化

获取原文
获取原文并翻译 | 示例
           

摘要

Degradation of temperature-control coatings (TCC) of "solar reflector" type caused by deposition of Au thin films was studied. "Mirror" OSO-S type coating and film PM-OA type coating were investigated. Au films with thickness of 1-24 nm were deposited on the samples by means of cathode sputtering of a pure Au target with the use of 300 eV Xe ions. A quartz microbalance was used for controlling the mass of the film deposited. The process was stopped when the frequency variation of the quartz resonator became equal to the given value. The film thickness was determined according to frequency variation of the quartz resonator. During the experiments, the thermo-optical properties (solar radiation absorptance A_S and emissivity ε) of TCC were measured at various film thicknesses. AFM investigations of the surface of samples were carried out too. As a result, the dependences of the values of A_S and e on the film thickness d are ascertained. It is found that a significant variation of the A_S/ε ratio is established under film thickness less than 3.5 nm. Such films are characterized by granular structure and low conductivity. In this case, when e variation is insufficient, changes in A_S value cause the main contribution to degradation of TCC properties. The permissible levels of contamination for OSO-S and PM-OA coatings are 1.2 × 10~(-6) and 6.7 × 10~(-6) g/cm~2 respectively. After deposition of a thick Au film, TCC properties are changed catastrophically: emissivity £ decreases to 0.2-0.3, absorptance increases by 2-3 times, and the A_S/ε ratio can increase by 5-10 times.
机译:研究了由Au薄膜沉积引起的“太阳反射器”型温度控制涂层(TCC)的劣化。 “镜子”OSO-S型涂层和薄膜PM-OA型涂层被研究。通过使用300eV Xe离子的纯Au靶的阴极溅射沉积厚度为1-24nm的Au薄膜。用于控制沉积的薄膜的质量的石英微稳定。当石英谐振器的频率变化变得等于给定值时,停止该过程。根据石英谐振器的频率变化确定膜厚度。在实验期间,在各种膜厚度下测量TCC的热光学性质(太阳辐射吸收率A_S和发射率ε)。对样品表面的AFM研究进行了。结果,确定A_S和E上的A_S和E的值的依赖性得到确定。发现在薄膜厚度小于3.5nm的膜厚度下建立A_S /ε比的显着变化。这种薄膜的特征在于粒状结构和低导电性。在这种情况下,当e变化不足时,A_S值的变化会导致TCC属性的劣化的主要贡献。 OSO-S和PM-OA涂层的允许水平分别为1.2×10〜(-6)和6.7×10〜(-6)g / cm〜2。在沉积厚的Au膜后,TCC属性发生灾难性:发射率为0.2-0.3,吸收率增加2-3次,A_S /ε比率可以增加5-10倍。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号