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首页> 外文期刊>Industrial Electronics, IEEE Transactions on >Contribution of End-Winding Proximity Losses to Temperature Variation in Electromagnetic Devices
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Contribution of End-Winding Proximity Losses to Temperature Variation in Electromagnetic Devices

机译:绕组末端接近损耗对电磁设备中温度变化的贡献

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摘要

This paper presents an investigation into proximity losses in end-windings informed from 3-D finite-element analysis of an ac power inductor. The proximity effect in winding conductors is a result of circulating ac currents caused by magnetic fields generated by nearby conductors. The calculated results confirm that the effects within the end-winding while significant are lower compared to those with the active length of the conductors. The common approach of predicting proximity losses using 2-D field analyses accounts for active length of the conductors only, and therefore, an end-winding correction factor is needed to obtain a more accurate estimate of loss. The theoretical prediction of losses within the inductor has been validated experimentally on a prototype inductor. A simple method to account for the interdependence of ac loss and temperature is presented and is shown to differ significantly from the well-known dc variation of resistance with temperature.
机译:本文对交流功率电感器的3D有限元分析所提供的端绕组中的邻近损耗进行了研究。绕组导体中的邻近效应是由附近导体产生的磁场引起的交流交流电流的结果。计算结果证实,与导体有效长度相比,端部绕组内的影响虽然显着,但较低。使用2-D场分析法预测接近损耗的常用方法仅考虑了导体的有效长度,因此,需要使用端部绕组校正因子来获得更准确的损耗估计。电感器内损耗的理论预测已在原型电感器上进行了实验验证。提出了一种简单的方法来解决交流损耗和温度之间的相互依赖性,并且该方法与众所周知的电阻随温度的直流变化显着不同。

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