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Characterization and Evaluation of the State-of-the-Art 3.3-kV 400-A SiC MOSFETs

机译:最新的3.3 kV 400-A SiC MOSFET的特性和评估

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摘要

Since their introduction, the SiC-based semiconductors have been of special interest to the field of power electronics, enabling increase in system efficiency, maximum operating temperature, and power density. In higher voltage range, these semiconductors are at early stage of development and yet are not commercialized. This paper investigates state-of-the-art noncommercialized 3.3-kV 400-A full-SiC MOSFETs where for the first time such MOSFETs are thoroughly characterized and their performance is evaluated and compared against similar rating Si counterparts. Extensive static and dynamic characterizations are done with emphasize on enabling conduction and switching loss calculation in any target application. I-V curves for MOSFET and Shottky-barrier diode (SBD), RDSon, C-V curves and threshold voltages are addressed by measurement at different temperatures. Moreover, the SiC MOSFETs are tested in chopper circuit with an inductive load for measurement of switching losses. This is done at 2-kV bus voltage from 50 up to 400 A load current. Finally, simulations are done in MATLAB/Simulink to evaluate the performance of 3.3-kV 400-A modules in medium-voltage high-power industrial drive application. The case study shows advantages of the 3.3-kV SiC MOSFET technology over 3.3-kV Si IGBTs and 1.7-kV SiC MOSFETs from efficiency, installed die area and power density points of view.
机译:自从引入以来,基于SiC的半导体一直在电力电子领域引起特别关注,可提高系统效率,最高工作温度和功率密度。在更高的电压范围内,这些半导体处于开发的早期阶段,但尚未商业化。本文研究了最新的非商业化的3.3kV 400A全SiC MOSFET,其中首次对此类MOSFET进行了全面表征,并对其性能进行了评估,并与相似额定值的Si同类产品进行了比较。广泛的静态和动态特性描述都着重于在任何目标应用中实现导通和开关损耗计算。 MOSFET和肖特基势垒二极管(SBD)的I-V曲线,RDSon,C-V曲线和阈值电压通过在不同温度下进行测量来解决。此外,SiC MOSFET在斩波电路中通过电感负载进行测试,以测量开关损耗。这是在50kV至400A负载电流的2kV总线电压下完成的。最后,在MATLAB / Simulink中进行了仿真,以评估3.3kV 400A模块在中压大功率工业驱动应用中的性能。案例研究从效率,安装芯片面积和功率密度的角度显示了3.3kV SiC MOSFET技术优于3.3kV Si IGBT和1.7kV SiC MOSFET的优势。

著录项

  • 来源
    《IEEE Transactions on Industrial Electronics》 |2017年第10期|8247-8257|共11页
  • 作者单位

    Center for Power Electronics Systems, The Bradley Department of Electrical and Computer Engineering, Virginia Polytechnic Institute and State University, Blacksburg, VA, USA;

    Center for Power Electronics Systems, The Bradley Department of Electrical and Computer Engineering, Virginia Polytechnic Institute and State University, Blacksburg, VA, USA;

    Center for Power Electronics Systems, The Bradley Department of Electrical and Computer Engineering, Virginia Polytechnic Institute and State University, Blacksburg, VA, USA;

    Center for Power Electronics Systems, The Bradley Department of Electrical and Computer Engineering, Virginia Polytechnic Institute and State University, Blacksburg, VA, USA;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Logic gates; Silicon carbide; MOSFET; Silicon; Insulated gate bipolar transistors; Switches; Medium voltage;

    机译:逻辑门;碳化硅;MOSFET;硅;绝缘栅双极型晶体管;开关;中压;
  • 入库时间 2022-08-17 13:03:14

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