Experimental evaluation of multiple Compton backscattering of gamma rays in copper

摘要

The gamma ray photons continue to soften in energy as the number of scatterings increases in thick target, and results in the generation of singly and multiply scattered events. The number of these multiply scattered events increases with an increase in target thickness and saturates beyond a particular target thickness known as saturation depth. The present experiment is undertaken to study the saturation depth for 279 and 320 keV incident gamma ray photons multiply backscattered from copper targets of varying thickness. The backscattered photons are detected by a Nal(Tl) gamma detector whose pulse-height distribution is converted into a photon spectrum with the help of an inverse matrix approach. To extract the contribution of multiply backscattered photons only, the spectrum of singly scattered photon is reconstructed analytically. We observe that the numbers of multiply scattered events increases with an increase in target thickness and then saturate. The saturation depth is found to be decreasing with increase in incident gamma energy. Keywords Multiple scattering - intensity distribution - backscattered inelastic peak - saturation thickness (depth) PACS Nos. 13.60.Fz - 32.80.Cy - 78.70.-g