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首页> 外文期刊>Indian Journal of Physics and Proceedings of the Indian Association for the Cultivation of Science. A >Trace element analysis of hot spring water by Particle Induced X-ray Emission (PIXE) method
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Trace element analysis of hot spring water by Particle Induced X-ray Emission (PIXE) method

机译:粒子诱导X射线(PIXE)法分析温泉水中的微量元素

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摘要

Particle Induced X-ray Emission (PIXE) technique is well suited for analysis of natural water due to its multielemental capability (Na to U) and uniform sensitivity. The high absolute sensitivity of PIXE, makes it possible to perform analysis of very small size samples [1]. Proton beams of 2-4 MeV obtained from the low energy tandem pelletron accelerator at Institute of Physics are used for the trace element analysis of water. Experimental facility and sample preparation laboratory have been established for PIXE analysis of environmental samples. PIXE method in combination with preconcentration technique, very low detection limits have been obtained for trace element analysis of hot spring water. Sample collection, preparation, irradiation, experimental setup and spectrum evaluation are discussed.
机译:粒子诱导X射线发射(PIXE)技术具有多元素分析能力(Na至U)且灵敏度均匀,因此非常适合于天然水的分析。 PIXE的高绝对灵敏度使对非常小的样品进行分析成为可能[1]。从物理研究所的低能串联压片加速器获得的2-4 MeV质子束用于水的痕量元素分析。建立了用于对环境样品进行PIXE分析的实验设施和样品制备实验室。 PIXE方法与预浓缩技术相结合,对温泉水中的痕量元素分析获得了非常低的检测限。讨论了样品的收集,制备,辐照,实验设置和光谱评估。

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