Cellular Automata Implementation of TPG Circuits for Built-In Two-Pattern Testing

摘要

Cellular automata (CA) implementations are ex- pected as potential test-pattern generators (TPGs) of Built-In Self-Testing of VLSI circuits, in which highly random parallel patterns ought to be generated with simple hardware. Objective here is to design one-dimensional, binary, and linear CA imple- mentations with cyclic boundary conditions that can operate on maximum length of period. To provide maximum period of oper- ations, it is necessary to bring some irregularities into the config- urations. It is also expected for TPGs to make maximum or suffi- ciently long period of operations to prevent re-initialization.