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InP HEMT Technology for High-Speed Logic and Communications

机译:用于高速逻辑和通信的InP HEMT技术

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摘要

As a review of the InP HEMT technology and its applications to logic ICs, the two-step-recess gate structure, which is now widely used in high-performance InP HEMTs, and its application to optoelectronic ICs are described. This paper also covers the topic of the gate delay analysis that reveals that the parasitic delay becomes the primary cause of the gate delay in sub-100-nm gate regime. For future challenge for logic applications, ways to reduce the off-state transistor current is also discussed.
机译:作为对InP HEMT技术及其在逻辑IC中的应用的综述,现在介绍了两步法栅极结构(现已广泛应用于高性能InP HEMT中)及其在光电IC中的应用。本文还涵盖了栅极延迟分析的主题,该主题揭示了在100 nm以下的栅极制程中,寄生延迟成为栅极延迟的主要原因。为了应对逻辑应用的未来挑战,还讨论了降低截止晶体管电流的方法。

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