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A Study on Temporal Dark Image Sticking in AC-PDP Using Vacuum-Sealing Method

机译:真空密封法研究AC-PDP中的时间暗像残留

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Minimizing the residual impurity gases is a key factor for reducing temporal dark image sticking. Therefore, this paper uses a vacuum-sealing method that minimizes the residual impurity gases by enhancing the base vacuum level, and the resultant change in temporal dark image sticking is then examined in comparison to that with the conventional sealing method using 42-in. ac-PDPs with a high Xe (11%) content. As a result of monitoring the difference in the display luminance, infrared emission, and perceived luminance between the cells with and without temporal dark image sticking, the vacuum-sealing method is demonstrated to reduce temporal dark image sticking by decreasing the residual impurity gases and increasing the oxygen vacancy in the MgO layer. Furthermore, the use of a modified driving waveform along with the vacuum-sealing method is even more etfective in reducing temporal dark image sticking.
机译:减少残留杂质气体是减少时间暗像残留的关键因素。因此,本文采用真空密封法,通过提高基本真空度来最大程度地减少残留的杂质气体,然后与使用42英寸的传统密封方法相比,研究了在时间上暗像残留的变化。 Xe(11%)含量高的ac-PDP。通过监视在有和没有临时暗像残留的单元之间的显示亮度,红外发射和感知亮度的差异,真空密封方法被证明可以通过减少残留的杂质气体并增加残留量来减少临时暗像残留。 MgO层中的氧空位。此外,将改进的驱动波形与真空密封方法一起使用在减少暂时暗像残留方面更为有效。

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