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The Contact Resistance Performance of Gold Coated Carbon-Nanotube Surfaces under Low Current Switching

机译:低电流切换下镀金的碳纳米管表面的接触电阻性能

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摘要

Multi-Walled CNT (MWCNT) are synthesized on a silicon wafer and sputter coated with a gold film. The planar surfaces are mounted on the tip of a piezo-electric actuator and mated with a gold coated hemispherical surface to form an electrical contact. These switching contacts are tested under conditions typical of MEMS relay applications; 4 V, with a static contact force of 1 mN, at a low current between 20-50 mA. The failure of the switch is identified by the evolution of contact resistance which is monitored throughout the switching cycles. The results show that the contact resistance can be stable for up to 120 million switching cycles, which are 10~6 orders of higher than state-of-the-art pure gold contact. Bouncing behavior was also observed in each switching cycle. The failing mechanism was also studied in relation to the contact surface changes. It was observed that the contact surfaces undergo a transfer process over the switching life time, ultimately leading to switching failure the number of bounces is also related to the fine transfer failure mechanism.
机译:在硅晶片上合成多壁CNT(MWCNT),并用金膜进行溅射镀膜。这些平面安装在压电致动器的尖端上,并与镀金的半球形表面配合以形成电接触。这些开关触点在MEMS继电器应用的典型条件下进行了测试; 4 V,静态接触力为1 mN,在20-50 mA之间的低电流下。开关的故障通过接触电阻的变化来识别,该电阻在整个开关周期中都受到监控。结果表明,接触电阻在高达1.2亿个开关周期内可以保持稳定,这比最先进的纯金触点高10到6个数量级。在每个开关周期中也观察到弹跳行为。还研究了与接触表面变化有关的失效机理。已经观察到,接触表面在切换寿命期间经历转移过程,最终导致切换失败,跳动的次数也与精细转移失败机制有关。

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