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A Study on Lateral Surface Treatment of the CdTe X-ray image-sensor

机译:CdTe X射线图像传感器的侧表面处理研究

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摘要

A CdTe X-ray sensor for dental X-ray imaging is fabricated and the effect of a lateral surface treatment is investigated. Due to non-uniform edge pixels in the CdTe X-ray sensor, the number of effective pixels that can be used for the final image is reduced, and a line defect is introduced when several sensors are put together for the target resolution. To improve the roughness of the lateral surface, a lateral surface polishing process is introduced. The polishing process reduces dead pixels by 76%, from 304 to 76. By lateral surface polishing, most of the dead pixels near the device edge become normal pixels. The non-uniform edge pixels are improved by the lateral surface treatment without affecting the central pixels of the CdTe X-ray image sensor. The effective resolution is extended to the edges of device; therefore, the entire area of the CdTe X-ray sensor can be used for the final image.
机译:制作了用于牙科X射线成像的CdTe X射线传感器,并研究了侧面表面处理的效果。由于CdTe X射线传感器中边缘像素的不均匀,减少了可用于最终图像的有效像素的数量,并且当将多个传感器组合在一起以达到目标分辨率时会引入线缺陷。为了改善侧面的粗糙度,引入了侧面抛光工艺。抛光过程将从304减少到76,减少了76%的坏点。通过侧面抛光,靠近设备边缘的大多数坏点都变为正常像素。通过侧面表面处理可以改善不均匀边缘像素,而不会影响CdTe X射线图像传感器的中心像素。有效分辨率扩展到设备的边缘。因此,CdTe X射线传感器的整个区域都可用于最终图像。

著录项

  • 来源
    《電子情報通信学会技術研究報告》 |2009年第98期|p.83-86|共4页
  • 作者单位

    Dept. of EECS, Korea Advanced Institute of Science and Technology, 335 Gwahangno, Yuseong-gu, Daejeon 305-701, Korea;

    i3system Company, 60-3 Jang-dong Yuseong-gu, Daejeon 305-343, Korea;

    Dept. of EECS, Korea Advanced Institute of Science and Technology, 335 Gwahangno, Yuseong-gu, Daejeon 305-701, Korea;

    Dept. of EECS, Korea Advanced Institute of Science and Technology, 335 Gwahangno, Yuseong-gu, Daejeon 305-701, Korea,National Nanofab Center, 335 Gwahangno, Yuseong-gu, Daejeon, 305-701, Korea;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    CdTe; X-ray; medical imaging sensor; lateral surface; surface treatment;

    机译:碲化镉;X射线医学成像传感器侧面表面处理;
  • 入库时间 2022-08-18 00:35:40

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