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Selective epitaxy growth mechanism of GaAs on circularly patterned GaAs (100) substrates by LPE and CCLPE

机译:LPE和CCLPE在圆形图案化GaAs(100)衬底上选择生长GaAs的外延生长机理

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摘要

Selective epitaxial growth of GaAs layers on SiN_x masked Si doped semi-insulating GaAs (100) substrates were performed by current controlled liquid phase epitaxy (CCLPE). Te doped GaAs epitaxial layers were grown on circularly patterned GaAs (100) substrates at a cooling rate of 40℃/h with and without applied electric current. Surface morphology of (100) facet of the grown layer, the vertical and lateral growth rates were improved to a great extent under applied electric current. A thick layer of 337 ìm with a lateral thickness of 268 um was achieved at 6 h growth with an applied current density of 20 Acm~(-2). The epitaxial growth was realized by electromigration of the solute and supercooling by a constant rate of furnace cooling. The electromigration of solute atoms enhanced the over all epitaxial growth.
机译:通过电流控制液相外延(CCLPE)在SiN_x掩膜的Si掺杂的半绝缘GaAs(100)衬底上选择性生长GaAs层。在有和没有施加电流的情况下,以40℃/ h的冷却速率在圆形图案化的GaAs(100)衬底上生长掺有Te的GaAs外延层。在施加电流的作用下,生长层的(100)面的表面形态,垂直和横向生长速率得到了很大程度的改善。在生长6小时,施加的电流密度为20 Acm〜(-2)的情况下,获得了337μm的厚层,横向厚度为268 um。通过溶质的电迁移和恒定的炉冷速率进行过冷来实现外延生长。溶质原子的电迁移增强了整个外延生长。

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