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Impact of Floating Body type DRAM with the Vertical MOSFET

机译:浮体型DRAM对垂直MOSFET的影响

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摘要

Several kinds of capacitor-less DRAM cells based on planar SOI-MOSFET technology have been proposed and researched to overcome the integration limit of the conventional DRAM. In this paper, we propose the Floating Body type DRAM with the Vertical MOSFET and discuss its basic operation using a 3-D device simulator. In contrast to previous planar SOI-MOSFET technology, the Floating Body type DRAM with the Vertical MOSFET achieves a cell area of 4F~2 and its floating body cell by isolating the body from the substrate vertically by the bottom-electrode. Therefore, the necessity for a SOI substrate is eliminated. The basic memory operation of read, write, and erase for Vertical type 1 transistor (1T) DRAM is shown, and in addition, the retention and disturb characteristics of the Vertical type IT-DRAM is discussed.
机译:为了克服常规DRAM的集成极限,已经提出并研究了几种基于平面SOI-MOSFET技术的无电容器DRAM单元。在本文中,我们提出了带有垂直MOSFET的浮体型DRAM,并讨论了使用3-D器件模拟器的基本操作。与以前的平面SOI-MOSFET技术相比,带有垂直MOSFET的浮体型DRAM通过底部电极将基体与衬底垂直隔离,从而实现了4F〜2的单元面积及其浮体单元。因此,消除了SOI衬底的需要。显示了用于垂直类型1晶体管(1T)DRAM的读取,写入和擦除的基本存储操作,此外,还讨论了垂直类型IT-DRAM的保持和干扰特性。

著录项

  • 来源
    《電子情報通信学会技術研究報告》 |2010年第109期|p.211-216|共6页
  • 作者

    Yuto Norifusa; Tetsuo Endoh;

  • 作者单位

    Center for Interdisciplinary Research, Tohoku University Aramaki aza Aoba 6-3, Aoba-ku, Sendai, 980-8578 Japan,JST-CREST 4-5-6 Kawada, Suita-shi, Osaka, 565-0456 Japan;

    Center for Interdisciplinary Research, Tohoku University Aramaki aza Aoba 6-3, Aoba-ku, Sendai, 980-8578 Japan,JST-CREST 4-5-6 Kawada, Suita-shi, Osaka, 565-0456 Japan;

  • 收录信息
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    vertical MOSFET; floating body type DRAM; 1T-DRAM; 4F~2;

    机译:垂直MOSFET;浮体型DRAM;1T-DRAM;4楼〜2楼;
  • 入库时间 2022-08-18 00:33:19

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