ハンマリング加振機構による電気接点の劣化現象: 摺動機構のモデリング（1）

摘要

Authors measured increasing resistances on electrical contacts by means of sliding contact mechanism respectively on the conditions that (1) sliding forces were 2.0N/pin or 0.3N/pin and (2) sliding amplitudes were ±5.0um or ±10.0um under the operation number of about 25milions. It was suggested that there was potentiality to make a model of the tendencies of contact variations in the primary stages in the above cases. It was suggested that there was the expanded model with logistic function and periodical components applied to averaged data. It was studied that there were the parameters (sliding force and sliding amplitude) which caused the relative displacements to electrical contacts about the time-sequential fluctuations of the contact resistances. And it was suggested that the simplified fluctuation model would be applied to the fluctuation of contact resistance.%著者らは，摺動接触機構において，摺動力2.0N／pinおよび0.3N/pin，摺動振幅±5.0μmおよび±10.0μmの条件で，それぞれ約2500万回の実験を行い，抵抗値の増加を測定した．また，変動初期における抵抗値の立ち上がりの傾向をモデル化の可能性を示唆できた．平均化（平滑化）したデータにおいてはロジスティック・関数に時間変動成分を付加した拡張モデルが適用できることが示唆された．接触抵抗の時系列変動における接点の相対変位に与えるパラメータ（摺動振幅・摺動力）の検討をした．そして，この接触抵抗値の変動には単純化した変動モデルが適用できる可能性が示唆された．