...
首页> 外文期刊>IEEE Transactions on Vehicular Technology >SNR Coverage Probability Analysis of RIS-Aided Communication Systems
【24h】

SNR Coverage Probability Analysis of RIS-Aided Communication Systems

机译:RIS辅助通信系统的SNR覆盖概率分析

获取原文
获取原文并翻译 | 示例
           

摘要

The reconfigurable intelligent surface (RIS) technique has received many interests, thanks to its advantages of low cost, easy deployment, and high controllability. It is acknowledged that the RIS can significantly improve the quality of signal transmission, especially in the line-of-sight-blocked scenarios. Therefore, it is critical to analyze the corresponding signal-to-noise ratio (SNR) coverage probability of RIS-aided communication systems. In this correspondence, we consider many practical issues to analyze the SNR coverage probability. We employ the realistic path loss model and Rayleigh fading model as large-scale and small-scale channel models, respectively. Meanwhile, we take the number and size of the RIS elements, as well as the placement of the RIS plane into considerations. We first derive the exact closed-form SNR coverage probability for a single element. Afterward, with the moment matching method, a highly accurate approximation of SNR coverage probability is formulated as the ratio of the upper incomplete Gamma function and Gamma function, allowing an arbitrary number of elements in the RIS. Finally, we comprehensively evaluate the impacts of essential factors on the SNR coverage probability, such as the number and size of the element, the coefficients of fading channel, and the angles of incidence and RIS plane. Overall, this work provides a succinct and general expression of SNR coverage probability, which can be helpful in the performance evaluation and practical implementation of the RIS.
机译:由于其优势,方便的部署和高可控性,可重新配置的智能表面(RIS)技术已经获得了许多兴趣。承认RIS可以显着提高信号传输的质量,尤其是在视线上阻止的场景。因此,分析RIS辅助通信系统的相应信噪比(SNR)覆盖概率至关重要。在这封对应关系中,我们考虑了分析SNR覆盖概率的许多实际问题。我们分别采用现实的路径损失模型和瑞利衰落模型作为大规模和小规模的渠道模型。同时,我们采取RIS元素的数量和大小,以及RIS平面将RIS平面放入考虑因素。我们首先导出单个元素的确切闭合SNR覆盖概率。之后,随着片刻匹配方法,将SNR覆盖概率的高度精确近似被配制为上不完全伽马功能和伽马功能的比率,允许RI中的任意数量的元件。最后,我们全面评估了基本因素对SNR覆盖概率的影响,例如元素的数量和尺寸,衰落通道系数,以及发病率和RIS平面的角度。总体而言,这项工作提供了SNR覆盖概率的简洁和一般表达,这有助于对RIS的性能评估和实际实施有所帮助。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号