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Linear ion trap for second-order Doppler shift reduction in frequency standard applications

机译:线性离子阱,用于降低频率标准应用中的二阶多普勒频移

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摘要

The authors have designed and are presently testing a novel linear ion trap that permits storage of a large number of ions with reduced susceptibility to the second-order Doppler effect caused by the RF confining fields. This new trap should store about 20 times the number of ions as a conventional RF trap with no corresponding increase in second-order Doppler shift from the confining field. In addition, the sensitivity of this shift to trapping parameters, i.e., RF voltage, RF frequency, and trap size, is greatly reduced. The authors have succeeded in trapping mercury ions and xenon ions in the presence of helium buffer gas. Trap times as long as 2* 10/sup 3/ s have been measured.
机译:作者已经设计并正在测试一种新型的线性离子阱,该离子阱可以存储大量离子,并且对RF限制场引起的二阶多普勒效应的敏感性降低。这个新的陷阱应存储的离子数量是传统RF陷阱的约20倍,并且从约束场起的二阶多普勒频移不会相应增加。另外,这种偏移对陷波参数即RF电压,RF频率和陷波尺寸的敏感性大大降低。作者已经成功地在存在氦缓冲气体的情况下捕获了汞离子和氙离子。测量的陷阱时间长达2 * 10 / sup 3 / s。

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