Electrolytic models for metallic electromigration failure mechanisms

摘要

Metallic electromigration is the movement of metallic material across a nonmetallic medium, under the influence of an electric field. It is increasingly important in the performance and reliability of electronic systems as an underling cause of functional failures in electrical and electronic components. This tutorial discusses the characteristics of the various electromigration mechanisms, with primary emphasis on electrolytically-controlled processes that occur under low power and relatively ambient conditions.