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Characterization of silicon pixel detectors with the n/sup +//p/sup +/ and double-sided multiguard ring structure before and after neutron irradiation

机译:中子辐照前后具有n / sup + // n / p / sup + /和双面多重保护环结构的硅像素探测器的表征

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摘要

The lifetime of silicon detectors in a severe radiation environment at CERN LHC depends strongly upon careful detector design and material selection, due to the anticipated radiation-induced damage. We fabricated recently more radiation-tolerant CMS forward pixel sensors with new designs of silicon pixel detectors with the n/sup +//p/sup +/ and double-sided multiguard ring structure. Electrical characterization of such devices was performed before and after irradiation to neutron fluences (1 MeV equivalent) up to 6/spl times/10/sup 14/ n/cm/sup 2/, measuring leakage current, potential distribution over the guard rings and full depletion voltage. Studies on the radiation hardness using oxygen-enriched silicon substrates are being presented separately.
机译:在CERN LHC的恶劣辐射环境中,硅探测器的寿命在很大程度上取决于仔细的探测器设计和材料选择,这是由于预期的辐射引起的损坏。我们最近使用具有n / sup + // n / p / sup + /和双面多重保护环结构的硅像素检测器的新设计,制造出了更耐辐射的CMS前向像素传感器。在辐照中子注量(1 MeV当量)之前和之后,对此类设备进行电学表征,直至6 / spl次/ 10 / sup 14 / n / cm / sup 2 /,测量漏电流,保护环上的电势分布和全耗尽电压。使用富氧硅衬底的辐射硬度的研究将单独介绍。

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