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首页> 外文期刊>IEEE Transactions on Nuclear Science >High-Speed FPGA-Based Pulse-Height Analyzer for High Resolution X-Ray Spectroscopy
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High-Speed FPGA-Based Pulse-Height Analyzer for High Resolution X-Ray Spectroscopy

机译:基于FPGA的高速脉冲高度分析仪,用于高分辨率X射线光谱学

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摘要

A complete four channel acquisition system for high-resolution spectroscopy has been designed and realized. The analog section is composed of four semi-Gaussian shaping amplifiers with two software-selectable shaping times. The shaping times (150 and 450 ns) were chosen to perform either high rate or best resolution XRF measurements with state-of-the-art multielement silicon drift detector. The pulses' amplitudes are caught by four large-bandwidth peak-stretchers whose outputs are multiplexed into a single 10 MHz 12-bit analog-to-digital converter (ADC). A field-programmable gate array (FPGA) operating at 24 MHz (or 48 MHz) clock frequency controls the whole process and stores the four spectra in the on-chip RAM, thus guaranteeing a maximum counting rate per bin of 332 kcps and an overall counting rate in excess of 4 Mcps. The system interfaces the host PC by means of the enhanced parallel port with a custom made control software for data visualization and analysis as in a conventional MCA system. If more than four channels have to be managed, various boards can be operated in parallel on the same EPP bus.
机译:设计并实现了用于高分辨率光谱的完整的四通道采集系统。模拟部分由四个半高斯整形放大器组成,具有两个软件可选择的整形时间。选择整形时间(150 ns和450 ns)以使用最新的多元素硅漂移检测器执行高速率或最佳分辨率XRF测量。脉冲的幅度由四个大带宽峰值展宽器捕获,这些峰值展宽器的输出被复用到一个10 MHz的12位模数转换器(ADC)中。以24 MHz(或48 MHz)时钟频率运行的现场可编程门阵列(FPGA)控制整个过程,并将四个频谱存储在片上RAM中,从而保证了每个bin的最大计数速率为332 kcps,计数率超过4 Mcps。与传统的MCA系统一样,该系统通过增强的并行端口与定制的控制软件对接主机PC,以进行数据可视化和分析。如果需要管理四个以上的通道,则可以在同一EPP总线上并行操作各种板。

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