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首页> 外文期刊>IEEE Transactions on Nuclear Science >Performance of scintillating waveguides for CCD-based X-ray detectors
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Performance of scintillating waveguides for CCD-based X-ray detectors

机译:基于CCD的X射线探测器的闪烁波导的性能

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Scintillating films are usually used to improve the sensitivity of CCD-based X-ray imaging detectors. For an optimal spatial resolution and detection efficiency, a tradeoff has to be made on the film thickness. However, these scintillating layers can also be structured to provide a pixellated screen. In this paper, the study of CsI(Tl)-filled pore arrays is reported. The pores are first etched in silicon, then oxidized and finally filled with CsI(Tl) to form scintillating waveguides. The dependence of the detector sensitivity on pore depth, varied from 40 to 400 /spl mu/m here, follows rather well theoretical predictions. Most of the detectors produced in this work have a detective quantum efficiency of the incoming X-ray photons of about 25%. However, one detector shows that higher efficiency can be achieved approaching almost the theoretical limit set by Poisson statistics of the incoming X-rays. Thus, we conclude that it is possible to fabricate scintillating waveguides with almost ideal performance. Imaging capabilities of the detectors are demonstrated.
机译:闪烁膜通常用于提高基于CCD的X射线成像检测器的灵敏度。为了获得最佳的空间分辨率和检测效率,必须在薄膜厚度上进行权衡。然而,这些闪烁层也可以被构造为提供像素化屏幕。本文报道了填充CsI(Tl)的孔阵列的研究。首先在硅中蚀刻这些孔,然后将其氧化并最终填充CsI(Tl),以形成闪烁波导。探测器灵敏度对孔深度的依赖性在此从40到400 / spl mu / m不等,遵循了相当好的理论预测。在这项工作中产生的大多数检测器对入射X射线光子的检测量子效率约为25%。但是,一个检测器表明,可以达到几乎由入射X射线的泊松统计所设定的理论极限几乎更高的效率。因此,我们得出结论,制造具有几乎理想性能的闪烁波导是可能的。演示了探测器的成像功能。

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