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首页> 外文期刊>IEEE Transactions on Nuclear Science >X–ᵞ-Ray Spectroscopy With a CdTe Pixel Detector and SIRIO Preamplifier at Deep Submicrosecond Signal-Processing Time
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X–ᵞ-Ray Spectroscopy With a CdTe Pixel Detector and SIRIO Preamplifier at Deep Submicrosecond Signal-Processing Time

机译:具有CDTE像素检测器和Sirio前置放大器的X-κ射线光谱在深亚微米的信号处理时间

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Advanced scientific and industrial applications based on X- and gamma-ray spectroscopic imaging need systems able to handle high incoming radiation flux (>1 Mcount/s) and, therefore, requiring processing of radiation detector signals in less than 1 mu s. The design and realization of very fast systems with high spatial and energy resolution still presents a complex challenge and it is the objective of the most recent research worldwide. Since room-temperature operation and high absorption efficiency (up to 100 keV of photon energy) are required for many applications, in addition to high energy resolution, cadmium telluride (CdTe) or CdZnTe detectors are the main choice for the task. In this framework, we have developed a research-grade spectroscopic system based on a pixel CdTe detector coupled to an ultralow noise custom charge preamplifier. The detector is 1 mm thick with 0.75 mm x 0.75 mm pixels with Schottky junction; the front-end electronics is SIRIO-6, a CMOS charge preamplifier specifically designed to have ultralow noise and fast response. The goal of this work is to study the spectroscopic capability of a CdTe pixel detector, suitable for spectroscopic imaging, at very short signal-processing times. Deep submicrosecond X-gamma-ray spectroscopy has been successfully accomplished using a trapezoidal pulse shaping with a 50-ns flat top and peaking times ranging from 1 mu s down to 50 ns. At room temperature, intrinsic energy resolutions [pulser full-width at half-maximum (FWHM)] from 205 eV (19.6 electrons rms) at 1 mu s to 392 eV (37.6 electrons rms) at 50 ns have been obtained and the FWHMs of the 241Am 59.54 keV line from 472 eV at 1 mu s to 617 eV at 50 ns peaking time have been measured, and, therefore, verifying the system capability to reach high energy resolution even at such short signal-processing times. The effects of very short signal-processing times on the electronic noise, ballistic deficit, and system linearity have been measured and discussed.
机译:基于X-和伽马射线光谱成像的先进的科学和工业应用需要能够处理高进入辐射通量(> 1 mcount / s)的系统,因此需要在小于1μs的辐射检测器信号的情况下处理。具有高空间和能量分辨率的非常快速系统的设计和实现仍然存在复杂的挑战,这是全球最近研究的目标。许多应用需要室温操作和高吸收效率(光子能量高达100keV),除了高能量分辨率外,碲化镉(CDTE)或CDZnte检测器是任务的主要选择。在本框架中,我们开发了一种基于像素CDTE检测器的研究级光谱系统,耦合到超级噪声定制电荷前置放大器。探测器厚1毫米厚,具有0.75毫米×0.75毫米像素,具有肖特基交界处的像素;前端电子设备是Sirio-6,CMOS充电前置放大器专门设计成具有超级噪声和快速响应。本作作品的目的是研究CDTE像素检测器的光谱能力,适用于光谱成像,在非常短的信号处理时间。使用梯形脉冲形状成功地完成了深层亚倍半标秒X-Gamma射线光谱,该梯形脉冲成形为50ns平顶和达到50ns的峰值时间。在室温下,获得了从205eV(19.6电子RMS)在50ns的205eV(19.6电子RMS)下的脉冲能力[半最大(FWHM)的全宽度(37.6电子RMS),还有FWHM已经测量了241AM 59.54 kev线从472EV以472EV,50ns峰值时间为50 ns峰值时间,因此,即使在这种短信时间,也能够验证系统能力以达到高能量分辨率。已经测量并讨论了非常短的信号处理时间对电子噪声,弹道缺陷和系统线性度的影响。

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