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首页> 外文期刊>IEEE transactions on nanotechnology >A Drift-Tolerant Read/Write Scheme for Multilevel Memristor Memory
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A Drift-Tolerant Read/Write Scheme for Multilevel Memristor Memory

机译:多级忆阻器存储器的耐漂移读/写方案

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摘要

Memristor based crossbar memories are prime candidates to succeed the Flash as the mainstream nonvolatile memory due to their density, scalability, write endurance and capability of storing multibit per cell. In this paper, we present a memristor crossbar memory architecture that utilizes a reduced constraint read-monitored-write scheme. The proposed scheme supports multibit storage per cell and utilizes reduced hardware, aiming to decrease the feedback complexity and latency while still operating with CMOS compatible voltages. We additionally present a read technique that can successfully distinguish resistive states under the existence of resistance drift due to read/write disturbances in the array. We also provide derivations of analytical relations to set forth a design methodology in selecting peripheral device parameters.
机译:基于忆阻器的交叉开关存储器由于其密度,可扩展性,写入耐力和每单元存储多位的能力,是取代Flash成为主流非易失性存储器的主要候选者。在本文中,我们提出了一种忆阻器交叉开关存储架构,该架构利用了减少约束的读监控写方案。提出的方案支持每个单元多位存储,并利用减少的硬件,旨在降低反馈的复杂性和等待时间,同时仍以CMOS兼容电压工作。我们还提出了一种读取技术,该技术可以在存在由于阵列中的读/写干扰而引起的电阻漂移的情况下成功地区分电阻状态。我们还提供了分析关系的推导,以阐明选择外围设备参数时的设计方法。

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