首页> 外文期刊>IEEE Transactions on Microwave Theory and Techniques >A triple-through method for characterizing test fixtures
【24h】

A triple-through method for characterizing test fixtures

机译:表征测试夹具的三重穿透方法

获取原文
获取原文并翻译 | 示例
获取外文期刊封面目录资料

摘要

Test fixtures for evaluating microwave components usually consist of two unmeasurable sections, each having, for example, one coaxial and one microstrip terminal. A method is proposed for evaluating the S-parameters of these sections through three conventional reflection/transmission measurements. The method is based on the use of an auxiliary two-port. A microstrip standard is not needed, except for a load which is necessary if the SWR (standing wave ratio) of the auxiliary two-port is not low enough. Only one reflection measurement with a load has to be performed on the auxiliary two-port, and even this may be cancelled if the two-port is a transition with low SWR. The method is broadband, frequency-insensitive, and extendable to other media such as waveguide and finline.
机译:用于评估微波组件的测试夹具通常由两个无法测量的部分组成,每个部分都具有例如一个同轴电缆和一个微带端子。提出了一种通过三个常规反射/透射测量来评估这些部分的S参数的方法。该方法基于辅助两端口的使用。除了辅助两端口的SWR(驻波比)不够低所必需的负载外,不需要微带线标准。在辅助两端口上仅需执行一个带有负载的反射测量,如果该两端口是具有低SWR的过渡,则甚至可以取消该测量。该方法是宽带的,对频率不敏感,并且可以扩展到其他介质,例如波导和鳍线。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号