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An integral equation method for the evaluation of conductor and dielectric losses in high-frequency interconnects

机译:用于评估高频互连中导体和介电损耗的积分方程方法

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摘要

An integral equation method is developed to solve for the complex propagation constant in multilayer planar structures with an arbitrary number of strip conductors on different levels. Both dielectric losses in the substrate layers and conductor losses in the strips and ground plane are considered. The Green's function included in the integral equation is derived by using a generalized impedance boundary formulation. The microstrip ohmic losses are evaluated by using an equivalent frequency-dependent impedance surface which is derived by solving for the fields inside the conductors. This impedance surface replaces the conducting strips and takes into account the thickness and skin effect of the strips at high frequencies. The effects of various parameters such as frequency, thickness of the lines, and substrate surface roughness on the complex propagation constant are investigated. Results are presented for single strips, coupled lines, and two-level interconnects. Good agreement with data available in the literature is shown.
机译:提出了一种积分方程方法,以解决多层平面结构中任意数量的带状导体在不同水平上的复传播常数。既要考虑衬底层中的介电损耗,又要考虑条带和接地平面中的导体损耗。积分方程中包含的格林函数是通过使用广义阻抗边界公式得出的。微带欧姆损耗通过使用等效频率相关的阻抗表面进行评估,该阻抗表面是通过求解导体内部的电场得出的。该阻抗表面代替了导电条,并考虑了高频下导电条的厚度和集肤效应。研究了诸如频率,线的粗细和基板表面粗糙度等各种参数对复数传播常数的影响。给出了单条,耦合线和两级互连的结果。显示了与文献中可用数据的良好一致性。

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