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首页> 外文期刊>IEEE Transactions on Microwave Theory and Techniques >Physical modeling of GaAs MESFETs in an integrated CAD environment: from device technology to microwave circuit performance
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Physical modeling of GaAs MESFETs in an integrated CAD environment: from device technology to microwave circuit performance

机译:集成CAD环境中GaAs MESFET的物理建模:从器件技术到微波电路性能

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摘要

The linkage between a physical device simulator for small- and large-signal characterization and CAD (computer-aided design) tools for both linear and nonlinear circuit analysis and design is considered. Efficient techniques for the physical DC and small-signal analysis of MESFETs are presented. The problem of physical simulation in a circuit environment is discussed, and it is shown how such a simulation makes possible small-signal models accounting for propagation and external parasitics. Efficient solutions for physical large-signal simulation, based on deriving large-signal equivalent circuits from small-signal analyses under different bias conditions, are proposed. The small- and large-signal characterizations allow physical simulation to be performed efficiently in a circuit environment. Examples and results are presented.
机译:考虑了用于小信号和大信号表征的物理设备仿真器与用于线性和非线性电路分析和设计的CAD(计算机辅助设计)工具之间的联系。提出了用于MESFET的物理DC和小信号分析的有效技术。讨论了电路环境中的物理仿真问题,并说明了这种仿真如何使考虑传播和外部寄生效应的小信号模型成为可能。提出了一种有效的物理大信号仿真解决方案,该方法基于在不同偏置条件下从小信号分析中得出大信号等效电路。小信号和大信号的特性允许在电路环境中有效地执行物理仿真。给出了示例和结果。

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