首页> 外文OA文献 >Physical modeling of GaAs MESFETs in an integrated CAD environment: from device technology to microwave circuit performance
【2h】

Physical modeling of GaAs MESFETs in an integrated CAD environment: from device technology to microwave circuit performance

机译:集成CAD环境中GaAs MESFET的物理建模:从器件技术到微波电路性能

代理获取
本网站仅为用户提供外文OA文献查询和代理获取服务,本网站没有原文。下单后我们将采用程序或人工为您竭诚获取高质量的原文,但由于OA文献来源多样且变更频繁,仍可能出现获取不到、文献不完整或与标题不符等情况,如果获取不到我们将提供退款服务。请知悉。

摘要

The linkage between a physical device simulator for small- and large-signal characterization and CAD (computer-aided design) tools for both linear and nonlinear circuit analysis and design is considered. Efficient techniques for the physical DC and small-signal analysis of MESFETs are presented. The problem of physical simulation in a circuit environment is discussed, and it is shown how such a simulation makes possible small-signal models accounting for propagation and external parasitics. Efficient solutions for physical large-signal simulation, based on deriving large-signal equivalent circuits from small-signal analyses under different bias conditions, are proposed. The small- and large-signal characterizations allow physical simulation to be performed efficiently in a circuit environment. Examples and results are presented
机译:考虑了用于小信号和大信号表征的物理设备仿真器与用于线性和非线性电路分析和设计的CAD(计算机辅助设计)工具之间的联系。提出了用于MESFET的物理DC和小信号分析的有效技术。讨论了电路环境中的物理仿真问题,并说明了这种仿真如何使考虑传播和外部寄生效应的小信号模型成为可能。提出了一种有效的物理大信号仿真解决方案,该方法基于在不同偏置条件下从小信号分析中得出大信号等效电路。小信号和大信号的特性允许在电路环境中有效地执行物理仿真。给出了例子和结果

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
代理获取

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号