Extended Through-Short-Delay Technique for the Calibration of Vector Network Analyzers With Nonmating Waveguide Ports

摘要

The extension of the through-short-delay (TSD) technique to the calibration of two-port vector network analyzers (VNAs) with nonmating waveguide ports is reported. The method retains the well-known high accuracy of the basic TSD technique while it enables to calibrate VNAs using two waveguide ports with different cross sections. Comparisons with the reciprocal-short-open-load technique commonly adopted to calibrate VNAs with nonconnectable ports and with theoretical data are reported. The present method can be adopted as either a one- or a two-tier calibration technique.