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首页> 外文期刊>Microwave Theory and Techniques, IEEE Transactions on >Enhanced Plasma Wave Detection of Terahertz Radiation Using Multiple High Electron-Mobility Transistors Connected in Series
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Enhanced Plasma Wave Detection of Terahertz Radiation Using Multiple High Electron-Mobility Transistors Connected in Series

机译:使用多个串联的高电子迁移率晶体管增强的太赫兹辐射等离子体波检测

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We report on enhanced room-temperature detection of terahertz radiation by several connected field-effect transistors. For this enhanced nonresonant detection, we have designed, fabricated, and tested plasmonic structures consisting of multiple InGaAs/GaAs pseudomorphic high electron-mobility transistors connected in series. Results show a 1.63-THz response that is directly proportional to the number of detecting transistors biased by a direct drain current at the same gate-to-source bias voltages. The responsivity in the saturation regime was found to be 170 V/W with the noise equivalent power in the range of 10-7 W/Hz0.5. The experimental data are in agreement with the detection mechanism based on the rectification of overdamped plasma waves excited by terahertz radiation in the transistor channel.
机译:我们报告了几个连接的场效应晶体管在室温下对太赫兹辐射的检测。对于这种增强的非共振检测,我们设计,制造和测试了由多个串联连接的InGaAs / GaAs伪晶高电子迁移率晶体管组成的等离子体结构。结果表明,在相同的栅极至源极偏置电压下,1.63 THz的响应与被直接漏极电流偏置的检测晶体管的数量成正比。发现饱和状态下的响应度为170 V / W,噪声等效功率在10-7 W / Hz0.5的范围内。实验数据与基于由晶体管通道中的太赫兹辐射激发的过阻尼等离子体波的整流的检测机制相一致。

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