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Experimental Characterization of Chiral Uniaxial Bianisotropic Composites at Microwave Frequencies

机译:微波频率下手性单轴双方各向异性复合材料的实验表征

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摘要

This paper presents an experimental procedure for retrieving the effective constitutive parameters of chiral materials. Unlike past research that primarily deals with isotropic materials, this study considers a lossy uniaxial bianisotropic slab with a nonzero chirality along its axial direction. First, plane-wave scattering off the uniaxial slab in a free-space environment is studied analytically. This forward analysis gives insight into the problem and the choice of proper independent measurements required for the inverse process, i.e., retrieving the slab constitutive parameters from its S-parameters. Based on this analysis, three sets of co-polarized and cross-polarized S-parameters are required, including both the transmission and reflection coefficients of the slab. Given the measured scattering data, the complex permittivity, permeability, and chirality tensors are determined numerically using the results of the analytic study. To test the performance of the new retrieval method, an array of 2 × 56 long, metallic helices is designed and fabricated for operation at C-band. Having the same handedness, the helices are closely spaced and held in parallel to each other in a wooden frame in order to create an effective uni-axial chiral medium. A conventional transmission/reflection setup measures the array scattering parameters, which are fed into the retrieval process to obtain the effective parameters. The measured parameters well model the array scattering response, exhibiting a significant averaged chirality of ~0.4 over 5.5-8.7 GHz and a plasmonic behavior at ~7.1GHz.
机译:本文提出了一种检索手性材料有效本构参数的实验程序。与以往主要研究各向同性材料的研究不同,本研究考虑了有损的单轴双同性平板,其轴向上的手性为非零。首先,对自由空间环境中单轴平板上的平面波散射进行了分析研究。这种前向分析可以洞悉问题,并且可以选择逆过程所需的适当独立测量值,即从其S参数中检索平板本构参数。基于此分析,需要三组同极化和交叉极化的S参数,包括平板的透射系数和反射系数。给定测量的散射数据,使用分析研究的结果以数值确定复数介电常数,磁导率和手性张量。为了测试新检​​索方法的性能,设计并制造了2×56长的金属螺旋阵列,以在C波段工作。具有相同的螺旋性,这些螺旋紧密地间隔开并彼此平行地保持在一个木制框架中,以便创建有效的单轴手性介质。传统的透射/反射设置会测量阵列散射参数,将其输入到检索过程中以获得有效参数。测得的参数很好地模拟了阵列的散射响应,在5.5-8.7 GHz范围内表现出〜0.4的显着平均手性,在〜7.1 GHz时具有等离子体特性。

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