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首页> 外文期刊>Microwave Theory and Techniques, IEEE Transactions on >Corrections to “Linear Analysis of High-Frequency Field-Effect Transistors Using the CN-FDTD Method”
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Corrections to “Linear Analysis of High-Frequency Field-Effect Transistors Using the CN-FDTD Method”

机译:对“使用CN-FDTD方法对高频场效应晶体管进行线性分析”的更正

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摘要

In the above-cited papern[1]n, the Crank–Nicolson finite-difference time-domain method is used for the analysis of a high-frequency field-effect transistor (FET). However, two references are missed. In addition, there are some errors in (6b),nFig. 2n, andnTable In. The reference of Figs. 1 andn2nisn[2]n. The reference ofnTable Inisn[3]n. In (6b),n$L_{mathrm {dd}}$n,n$L_{mathrm {gg}}$n,n$L_{mathrm {ss}}$n,n$M_{mathrm {gd}}$n, andn$G_{m}$nshould be, respectively,n$L_{mathrm {d}}$n,n$L_{mathrm {g}}$n,n$L_{mathrm {s}}$n,n$M_{mathrm {dg}}$n, andn$g_{m}$n. The corrected version ofnFig. 2nis depicted here, wherein the designations are consistent with the present correction. The corrected table is also reported here, subsequently, wherein the values are valid when the transistor is biased atn$V_{mathrm {ds}} = 3$nV andn$I_{mathrm {ds}} = 10$nmA.
机译:在上面引用的papern [1]n,Crank–Nicolson时域有限差分法用于分析高频场效应晶体管(FET)。但是,缺少两个参考。此外,(6b),n 图。 2 n,n 表I n。参考图。 1 andn 2 nisn [2] n。引用n 表I nisn [3] n。在(6b)中,n <内联公式xmlns:mml =“ http://www.w3.org/1998/Math/MathML” xmlns:xlink =“ http://www.w3.org/1999/xlink” > $ L_ {mathrm {dd}} $ n,n $ L_ {mathrm {gg}} $ < / tex-math> n,n $ L_ {mathrm {ss}} $ n,n $ M_ {mathrm {gd}} $ n,n $ G_ {m} $ n $ L_ {mathrm {d}} $ n ,n $ L_ {mathrm {g}} $ n,n $ L_ {mathrm {s}} $ n,n $ M_ {mathrm {dg}} $ n和n $ g_ {m} $ n。 n 图。这里描绘了图2的附图标记,其中,该名称与当前的校正一致。随后在此还报告了校正后的表,其中,当晶体管在n $ V_ {mathrm {ds}} = 3 $ nV andn $ I_ {mathrm {ds}} = 10 $ nmA。

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