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Weighted regularization in electrical impedance tomography with applications to acute cerebral stroke

机译:电阻抗层析成像中的加权正则化及其在急性脑卒中中的应用

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摘要

We apply electrical impedance tomography to detect and localize brain impedance changes associated with stroke. Forward solutions are computed using the finite-element method in two dimensions. We assume that baseline conductivity values are known for the major head tissues, and focus on changes in the brain compartment only. We use singular-value decomposition (SVD) to show that different impedance measurement patterns, which are theoretically equivalent by the reciprocity theorem, have different sensitivities to the brain compartment in the presence of measurement noise. The inverse problem is solved in part by standard means, using iterated SVD, and regularizing by truncation. To improve regularization we introduce a weighting scheme which normalizes the sensitivity matrix for voxels at different depths. This increases the number of linearly independent components which contribute to the solution, and forces the different measurement patterns to have similar sensitivity. When applied to stroke, this weighted regularization improves image quality overall.
机译:我们应用电阻抗断层扫描来检测和定位与中风相关的脑部阻抗变化。使用二维有限元方法计算正解。我们假设主要头组织的基线电导率值已知,并且仅关注脑室的变化。我们使用奇异值分解(SVD)来显示,在存在测量噪声的情况下,互易性定理在理论上等效的不同阻抗测量模式对脑室的敏感性不同。反问题部分地通过标准方法来解决,即使用迭代SVD并通过截断进行正则化。为了改善正则化,我们引入了一种加权方案,该方案对不同深度的体素的灵敏度矩阵进行了归一化。这增加了有助于解决方案的线性独立分量的数量,并迫使不同的测量模式具有相似的灵敏度。当应用于笔画时,此加权正则化总体上改善了图像质量。

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