Extinction Ratio in Apertureless Reflection-Mode Magneto-Optical Scanning Near-Field Optical Microscopy

摘要

We developed a reflection-mode scanning near-field optical microscopy (SNOM) with an apertureless probe with a high special resolution and a high extinction ratio. Patterned Chromium film with a checker pattern deposited on a quartz substrate was measured. In SNOM images, clear contrast between Chromium and quartz was obtained, and the spatial resolution was determined to be ${sim}30$ nm. A polarization property of scattered light from the near field was also investigated for both p- and s-polarized incidence. The extinction ratios for both polarization were found to be larger than 100.