Influence of the Thickness of the Ferro- and Antiferromagnetic Phases on Magnetic Properties in Epitaxial Heterostructures Based on Exchange Biased La-Ca-Mn-O System

摘要

Metal oxides show fascinating physical properties such as ferromagnetism, antiferromagnetism, high temperature superconductivity, ferroelectricity, or even multiferroicity. For many possible electronic applications as well as fundamental studies, it is essential to fabricate epitaxial layered films and multilayers of these materials having complex lattice structures with sharp interfaces, preserving epitaxiallity through the whole structure. We have grown these kind of oxide heterostructures on single crystal (001) oriented SrTiO$_{3}$ substrates by using an in-situ DC sputtering technique at high oxygen pressures. Specifically, we report the study of magnetic and transport properties in ferromagnetic/antiferromagnetic, F/AF, heterostructures based on the Ca-doped lanthanum manganite system. We artificially grew La$_{2/3}$ Ca $_{1/3}$MnO$_{3}$/La$_{1/3}$ Ca $_{2/3}$MnO$_{3}$ heterostructures, maintaining constant the total thickness of the sample and systematically varying the thicknesses of the antiferromagnetic layer $(t_{rm AF})$ and ferromagnetic layer $(t_{F})$. Magnetization measurements indicate a dependence of Curie temperature, exchange bias field, and magnetoresistance behavior with the $t_{rm AF}/t_{F}$ ratio.